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Detailed Course Information


Aug 21, 2017
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CSC 632 - ULSI Testing
This course covers the problems of testing of Ultra Large Scale Integrated Circuits (ULSI), the design of circuits for testability, the design of built-in self-testing circuits, and the use of the IEEE Boundary Scan Standards. Topics include an introduction to the testing process, fault modeling and detection, logic and fault simulation, testability measures, test generation for combinational circuits, test generation for sequential circuits, design for testability, built-in self-test, delay testing, current testing, ATPG-based logic synthesis, system test and core-based design, and testing a system-on-a-chip. [3-0, 3 cr.]
3.000 Credit hours
3.000 Lecture hours

Levels: Graduate
Schedule Types: Lecture, Tutorial

Computer Science & Mathematics Division
Computer Science Department

May not be enrolled in one of the following Programs:     
      Freshman Science
      Freshman Arts
Must be enrolled in one of the following Levels:     
May not be enrolled in one of the following Degrees:     
      Executive MBA

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